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90% QE @ 550 nm9 μm × 9 μm4096 (H) x 4096 (V)16.5 fps @ 16MPCameraLink & USB3.0

74% QE @ 600 nm9 μm × 9 μm4096 (H) x 4096 (V)16.5 fps @ 16MPCameraLink & USB3.0

18.8 mm (1.2″)6.5 μm × 6.5 μm2048 (H) x 2048 (V)40 fps @ 16 bitUSB 3.0

32 mm (2″)11 μm × 11 μm2048 (H) x 2048 (V)91ke- 滿阱容量2e- 讀出噪聲

彩色 sCMOS6.5 μm × 6.5 μm2048 (H) x 2048 (V)22 fps @ 8 bitUSB3.0

72% QE @ 595nm6.5 μm × 6.5 μm2048 (H) x 2040 (V)35fps @ 16bitUSB3.0

95% QE @ 600nm6.5 μm × 6.5 μm2048 (H) x 2048 (V)100fps @ 4.2MPCameraLink & USB3.0

450 fps @ 21MPGlobal Shutter29.5mm Diagonal5120 (H) x 4096 (V)風(fēng)冷 / 水冷

15.3 mm (1″)6.5 μm × 6.5 μm2048 (H) x 1152 (V)70 fps @ 16 bitUSB 3.0

95 % 峰值QE6.5 μm Pixels29.4 mm Diagonal FOV150 fps @ 10.2MP0.7 e- Readout Noise

95% Peak QE6.5 μm Pixel22 mm Diagonal FOV200 fps @ Full Resolution0.7 e- Readout Noise

SIRM是非接觸和非破壞型光學(xué)檢測(cè)設(shè)備，對(duì)體微缺陷，如氧化物和金屬沉淀，位錯(cuò)、堆垛層錯(cuò)，體材料中的滑線和空隙等進(jìn)行測(cè)試。這個(gè)技術(shù)也可對(duì)GaAs 和 InP等復(fù)合材料進(jìn)行測(cè)試。